1. Inspection Compartment
2. Sample Door
3. Sample Door Handle
4. Work Station
5. Electronics Compartment
6. Camera
7. Illumination Optics
8. Sample Stages
9. Source Measurement Unit
10. Server
11. Programmable Logic Controller (including laser safety control)
Add new capability to your BT Imaging lab tool
A new range of advanced wafer and cell analysis packages available as options on the new LIS-R3 and as software upgrades to your existing BT Imaging LIS-R1, LIS-R2 laboratory tools. Includes (1) Cell IV package, (2) Advanced cell measurement package, (3) Cell Front and bulk separation package, (4) Multi-crystalline wafer algorithm package, (5) Mono-crystalline wafer analysis package, and (6) Thick mono wafer slug analysis package.
Support for 5BB and 6BB cell designs
This is our new Cell Stage for the LIS-R series tools which includes 5 or 6 Probe Rails as installed and is suitable for Solar Cells with 3,4,5 or 6 busbars. One or more Probe Rails can be removed if required to allow for measurement of 3 or 4 busbar cells.This new upgraded cell stage allows for improved quality of Rs and EL and the enablement of the new Advanced Cell Software Analysis Package.
Bricks & Ingots | As-Cut Wafers | In-Process Solar Cells | Completed Solar Cells | Mini-Modules | |
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Photoluminescence Imaging |
LIS-R2-Plus (Option) LIS-R3 (Option) |
LIS-R2-Plus LIS-R3 |
LIS-R2-Plus LIS-R3 |
LIS-R2-Plus LIS-R3 |
LIS-R2-Plus (Option) LIS-R3 (Option) |
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Electroluminescence Imaging |
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LIS-R2-Plus (Option) LIS-R3 (Option) |
LIS-R2-Plus (Option) LIS-R3 (Option) |
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Electrically Biased PL Imaging |
LIS-R2-Plus (Option) LIS-R3 (Option) |
LIS-R2-Plus (Option) LIS-R3 (Option) |
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Injection Level Dependent Lifetime (QSS-Photo-conductance) |
LIS-R2-Plus (Option) |
LIS-R2-Plus (Option) |
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Calibrated Lifetime Imaging |
LIS-R2-Plus (Option) |
LIS-R2-Plus (Option) |
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Series Resistance Imaging |
LIS-R2-Plus (Option) |
LIS-R2-Plus (Option) |
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Dark & Light IV, Suns-Voc Curves |
LIS-R3 (Option) |
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Jsc, Voc, Jmpp, Jo and Efficiency imaging |
LIS-R3 (Option) | ||||
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Front and bulk analysis |
LIS-R3 (Option) |
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Multi-crystalline Silicon Defects & Impurities |
LIS-R3 (Option) |
LIS-R3 (Option) |
LIS-R3 (Option) |
LIS-R3 (Option) |
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Mono-crystalline Silicon Defects & Impurities |
LIS-R3 (Option) |
LIS-R3 (Option) |
LIS-R3 (Option) |
LIS-R3 (Option) |
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Thick Mono Wafer Slug Analysis Package | LIS-R3 (Option) |
Contact Us | +1 (855) 222-5856
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