LIS-R2-Plus

BT Imaging

The LIS-R2-Plus benefits from substantial development work at BT Imaging leading to cost reductions on the LIS-R2 lab tool platform. We at BT Imaging are passing on these cost reductions to customers via the new LIS-R2-Plus platform. This new LIS-R2-Plus is the leading comprehensive luminescence laboratory inspection tool for silicon bricks, wafers and cells It is also ideally suited to be used at cell manufacturing lines for sampling, enabling fast ‘next-to-line’ process feedback and debugging. Backed by BT Imaging’s substantial patent portfolio.

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Type: Metrology


Tool Layout
Layout1

1. Inspection Compartment

2. Sample Door

3. Sample Door Handle

4. Work Station

5. Electronics Compartment

Layout2

6. Camera

7. Illumination Optics

8. Sample Stages

9. Source Measurement Unit

10. Server

11. Programmable Logic Controller (including laser safety control)

 

Measurement Applications

 

Bricks & Ingots As-Cut Wafers In-Process Solar Cells Completed Solar Cells Mini-Modules






Photoluminescence Imaging

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus LIS-R3

LIS-R2-Plus LIS-R3

LIS-R2-Plus LIS-R3

LIS-R2-Plus (Option) LIS-R3 (Option)







Electroluminescence Imaging

 

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus (Option) LIS-R3 (Option)







Electrically Biased PL Imaging

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus (Option) LIS-R3 (Option)







Injection Level Dependent Lifetime (QSS-Photo-conductance)

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Calibrated Lifetime Imaging

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Series Resistance Imaging

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Dark & Light IV, Suns-Voc Curves

LIS-R3 (Option)







Jsc, Voc, Jmpp, Jo and Efficiency imaging

LIS-R3 (Option)






Front and bulk analysis

LIS-R3 (Option)







Multi-crystalline Silicon Defects & Impurities

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)







Mono-crystalline Silicon Defects & Impurities

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)







Thick Mono Wafer Slug Analysis Package
LIS-R3 (Option)

 

Optional Upgrades

Upgrades brochure »

LIS-R Series Software Upgrade Packages

LIS-R Series Software Upgrade Packages

Add new capability to your BT Imaging lab tool

A new range of advanced wafer and cell analysis packages available as options on the new LIS-R3 and as software upgrades to your existing BT Imaging LIS-R1, LIS-R2 laboratory tools. Includes (1) Cell IV package, (2) Advanced cell measurement package, (3) Cell Front and bulk separation package, (4) Multi-crystalline wafer algorithm package, (5) Mono-crystalline wafer analysis package, and (6) Thick mono wafer slug analysis package.


 

LIS-R Series Cell Stage Upgrade

LIS-R Series Cell Stage Upgrade

Support for 5BB and 6BB cell designs

This is our new Cell Stage for the LIS-R series tools which includes 5 or 6 Probe Rails as installed and is suitable for Solar Cells with 3,4,5 or 6 busbars. One or more Probe Rails can be removed if required to allow for measurement of 3 or 4 busbar cells.This new upgraded cell stage allows for improved quality of Rs and EL and the enablement of the new Advanced Cell Software Analysis Package.


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