LIS-R3

BT Imaging

A new and updated advanced laboratory tool for silicon bricks, ingots, wafers, cells and mini-modules. Used by world leading researchers in institutions and wafer, cell and module manufacturers, key applications include process improvement, R&D, process debug and root cause analysis, QA & QC, and accelerated install and FAT of production equipment.

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Type: Metrology


Tool Layout
Layout1

1. Inspection Compartment

2. Sample Door

3. Sample Door Handle

4. Work Station

5. Electronics Compartment

Layout2

6. Camera

7. Illumination Optics

8. Sample Stages

9. Source Measurement Unit

10. Server

11. Programmable Logic Controller (including laser safety control)

 


 

Includes

 

  • Proprietary photoluminescence
  • Series resistance imaging
  • Electroluminescence imaging
  • Biased photoluminescence imaging
  • QSS-PC injection level dependent lifetime
  • Calibrated lifetime imaging
  • Automated wafer and brick defect measurements based on image processing algorithms
  • Suns-Voc, dark and light IV measurements
  • Plus a number of new analysis methods as part of the LIS-R Series Software Upgrade Package.

 


 

Optional Upgrades

Upgrades brochure »

LIS-R Series Software Upgrade Packages

LIS-R Series Software Upgrade Packages

Add new capability to your BT Imaging lab tool

A new range of advanced wafer and cell analysis packages available as options on the new LIS-R3 and as software upgrades to your existing BT Imaging LIS-R1, LIS-R2 laboratory tools. Includes (1) Cell IV package, (2) Advanced cell measurement package, (3) Cell Front and bulk separation package, (4) Multi-crystalline wafer algorithm package, (5) Mono-crystalline wafer analysis package, and (6) Thick mono wafer slug analysis package.


 

LIS-R Series Cell Stage Upgrade

LIS-R Series Cell Stage Upgrade

Support for 5BB and 6BB cell designs

This is our new Cell Stage for the LIS-R series tools which includes 5 or 6 Probe Rails as installed and is suitable for Solar Cells with 3,4,5 or 6 busbars. One or more Probe Rails can be removed if required to allow for measurement of 3 or 4 busbar cells.This new upgraded cell stage allows for improved quality of Rs and EL and the enablement of the new Advanced Cell Software Analysis Package.

 


 

Measurement Applications

 

Bricks & Ingots As-Cut Wafers In-Process Solar Cells Completed Solar Cells Mini-Modules






Photoluminescence Imaging

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus LIS-R3

LIS-R2-Plus LIS-R3

LIS-R2-Plus LIS-R3

LIS-R2-Plus (Option) LIS-R3 (Option)







Electroluminescence Imaging

 

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus (Option) LIS-R3 (Option)







Electrically Biased PL Imaging

LIS-R2-Plus (Option) LIS-R3 (Option)

LIS-R2-Plus (Option) LIS-R3 (Option)







Injection Level Dependent Lifetime (QSS-Photo-conductance)

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Calibrated Lifetime Imaging

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Series Resistance Imaging

LIS-R2-Plus (Option)
LIS-R3 (Option)

LIS-R2-Plus (Option)
LIS-R3 (Option)







Dark & Light IV, Suns-Voc Curves

LIS-R3 (Option)







Jsc, Voc, Jmpp, Jo and Efficiency imaging

LIS-R3 (Option)






Front and bulk analysis

LIS-R3 (Option)







Multi-crystalline Silicon Defects & Impurities

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)







Mono-crystalline Silicon Defects & Impurities

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)

LIS-R3 (Option)







Thick Mono Wafer Slug Analysis Package
LIS-R3 (Option)

 


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